What is the semiconductor HAST test? Why is it necessary to do HAST test for semiconductors? This article will give you an answer.
Application of semiconductors
Semiconductors are materials with electrical conductivity between conductors and insulators at room temperature, such as silicon, germanium, gallium arsenide, etc. Semiconductor materials are widely used in various industries and have an important impact on scientific and economic development.
● Photovoltaic: Solar cells are mainly divided into crystalline silicon solar cells and thin-film solar cells, using different semiconductor materials.
● Lighting: LED lighting technology, also known as semiconductor lighting technology, has been applied in all aspects of our lives. For example, traffic lights, indoor lighting, street lights, electronic product backlights, car lights, LED displays, landscape lights, etc.
● Power conversion: electric vehicle inverters and converters, power grid systems, electronic product chargers, solar micro inverters, 5G/6G base stations, radars, rail transit, etc.
● Application industries also include: computers, medical, engineering machinery, robots, automotive electronics, cloud computing, security and artificial intelligence.
Difference between semiconductors, chips and integrated circuits
Semiconductor products can be divided into four categories according to their application fields and functions, namely integrated circuits, discrete devices, optoelectronic devices, and sensors. Among them, integrated circuits are the largest and most core products in the semiconductor industry. Many people regard integrated circuits, semiconductors, and chips as the same thing, but in fact they are different:
● Semiconductors are important materials for chips and integrated circuits.
● Chip is a general term for semiconductor component products and is the carrier of integrated circuits.
● Integrated circuits integrate multiple electronic components into a single chip.
Semiconductor HAST Test
1.Semiconductor packaging
Microelectronic devices are divided into hermetic packaging and non-hermetic packaging according to the sealing method. Hermetic packaging includes metal, ceramic, and glass packaging, and non-hermetic packaging mostly uses plastic packaging. Non-hermetic packaging has low cost and can meet the requirements of most electronic products. Hermetic packaging has good heat dissipation and high stability. It is mainly used in military and aerospace industries. The choice of semiconductor packaging material depends on the specific application requirements and cost.
2.HAST chamber
HAST is the abbreviation of highly accelerated stress test, which is a test to evaluate the performance reliability of products under high temperature, high humidity and high pressure conditions. HAST is divided into saturated and unsaturated types. The saturated HAST test conditions are 121℃ and 100%RH. The unsaturated HAST test conditions are 110/120/130℃ and 85%RH. HAST chamber is a climatic chamber designed to meet the HAST test conditions. It is widely used in reliability testing of products such as PCB, semiconductors, solar panels, and display panels.
In the semiconductor industry, HAST chamber is a commonly used test equipment, mainly used to test non-hermetic semiconductors. By placing the semiconductor (chip) under high temperature and high humidity conditions, moisture enters the semiconductor package. Observe the possible effects of high temperature and high humidity on semiconductor performance. Using HAST chamber can accelerate the aging of semiconductors, reduce testing time and cost, and help semiconductor manufacturers discover potential problems with products.
3.Semiconductor HAST Test Standards
HAST has become an essential test standard and test item in some industries. The following are the standards related to HAST in the semiconductor industry:
● IEC 60068-2-66: Environmental testing – Part 2: Test methods – Test Cx: Damp heat, steady state (unsaturated pressurized vapour)
● IEC 60749-4:Semiconductor devices – Mechanical and climatic test methods – Part 4: Damp heat, steady state, highly accelerated stress test (HAST)
● JIS C60068-2-66: Environmental testing — Part 2: Test methods — Test Cx: Damp heat, steady state (unsaturated pressurized vapour)
● JESD22-A110: HIGHLY ACCELERATED TEMPERATURE AND HUMIDITY STRESS TEST (HAST)
● JESD22-A118: Accelerated Moisture Resistance – Unbiased HAST
● JESD22-A102: Accelerated Moisture Resistance – Unbiased Autoclave
● AEC-Q100-Rev-H: FAILURE MECHANISM BASED STRESS TEST QUALIFICATION FOR INTEGRATED CIRCUITS
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